• Voir la page en français

Optical metrology

  • Compare data measured with the theoretical definition (CAD model),
  • Create a report containing mappings of deviations or mappings of thicknesses.

These mappings may also contain results tables, inspection sections, measurements of diameters, angles and planarity.

The mappings are available in a 3D format and can be used on your PC, using a free visualization software program developed by the manufacturer of our sensors.